Die Warpage Control Applying UBM (Under Bump Metallurgy) on Die Back-Side for FanOut Package Process Applications

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Die Warpage Control Applying UBM (Under Bump Metallurgy) on Die Back-Side for FanOut Package Process Applications
저자
김영호
발행일
2018-05-30
학회명
The 2018 IEEE 68th Electronic Components, and Technology Conference
개최지
Sheraton San Diego Hotel & Marina San Diego, California, USA