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A Study on Degradation Mechanism of Flexible a-InGaZnO Thin Film Transistor Under Repetitive Bending Stress Using Simulation
- 제목
- A Study on Degradation Mechanism of Flexible a-InGaZnO Thin Film Transistor Under Repetitive Bending Stress Using Simulation
- 저자
- 박진성
- 발행일
- 2018-12-13
- 학회명
- 25th International Display Workshops
- 개최지
- Nagoya Congress Center, Nagoya, Japan