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Correlation Between Defects and Electrical Properties of Oxide Semiconductor Materials by Photo-Induced Current Transient Spectroscopy
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- Correlation Between Defects and Electrical Properties of Oxide Semiconductor Materials by Photo-Induced Current Transient Spectroscopy
- 저자
- 홍진표
- 발행일
- 2025-04-23
- 학회명
- 2025년 봄 학술논문발표회
- 개최지
- 대전 컨벤션센터