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Material design for Ge₂Sb₂Te₅ phase-change material with thermal stability and lattice distortion
Material design for Ge2Sb2Te5 phase-change material with thermal stability and lattice distortion
- Choi, Minho;
- Choi, Heechae;
- Ahn, Jinho;
- Kim, Yong Tae
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11초록
To overcome the reliability issue of phase-change memory, the development of stable phase-change materials is extremely important. In this study, we analyze 13 dopants for Ge₂Sb₂Te₅ (GST) based on two criteria: i) the change in thermal stability by doping and ii) a lattice distortion. After doping the elements, 11 elements showed a negative doping formation energy compared with pure GST. The angular distortion of the Zn dopant is the largest. The hole carrier decreases, and the electrical resistance increases through Zn-doping in GST. The increased resistance of the material can lead to low power consumption with a high energy effectiveness.
키워드
Phase-change material; Phase-change memory; Doping; Ge2Sb2Te5; Lattice distortion; GENERALIZED GRADIENT APPROXIMATION; DOPED GE2SB2TE5; ELECTRICAL-PROPERTIES; FILMS
- 제목
- Material design for Ge₂Sb₂Te₅ phase-change material with thermal stability and lattice distortion
- 제목 (타언어)
- Material design for Ge2Sb2Te5 phase-change material with thermal stability and lattice distortion
- 저자
- Choi, Minho; Choi, Heechae; Ahn, Jinho; Kim, Yong Tae
- 발행일
- 2019-09
- 유형
- Article
- 권
- 170
- 페이지
- 16 ~ 19