Effects of an In Vacancy on Local Distortion of Fast Phase Transition in Bi-doped In₃SbTe₂

Effects of an In Vacancy on Local Distortion of Fast Phase Transition in Bi-doped In3SbTe2
  • Choi, Minho
  • Choi, Heechae
  • Kim, Seungchul
  • Ahn, Jinho
  • Kim, Yong Tae
Citations

WEB OF SCIENCE

1
Citations

SCOPUS

1

초록

Indium vacancies in Bi-doped In3SbTe2 (BIST) cause local distortion or and faster phase transition of BIST with good stability. The formation energy of the In vacancy in the BIST is relatively lower compared to that in IST due to triple negative charge state of the In vacancy (V-In³⁻) and higher concentration of the V-In³ in BIST. The band gap of BIST is substantially reduced with increasing concentrations of the V-In³⁻ and the hole carriers, which results in a higher electrical conductivity. The phase-change memory (PRAM) device fabricated with the BIST shows very fast, stable switching characteristics at lower voltages.

키워드

Phase change materialPhase change memoryDistortionVacancyRANDOM-ACCESS MEMORYTHIN-FILMSLATTICE-DISTORTIONATOMIC-SIZEALLOY
제목
Effects of an In Vacancy on Local Distortion of Fast Phase Transition in Bi-doped In₃SbTe₂
제목 (타언어)
Effects of an In Vacancy on Local Distortion of Fast Phase Transition in Bi-doped In3SbTe2
저자
Choi, MinhoChoi, HeechaeKim, SeungchulAhn, JinhoKim, Yong Tae
DOI
10.3938/jkps.71.946
발행일
2017-12
유형
Article
저널명
Journal of the Korean Physical Society
71
12
페이지
946 ~ 949