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Comparative Study of Electron Mobility involving Self-heating Effect in 45nm Ultra-Thin Body SOI, Strained Si SGOI, and Strained SOI n-MOSFETs

  • 박재근
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Comparative Study of Electron Mobility involving Self-heating Effect in 45nm Ultra-Thin Body SOI, Strained Si SGOI, and Strained SOI n-MOSFETs
저자
박재근
발행일
2008-04-18
학회명
한국물리학회 2008년 봄 학술발표회 및 제84회 정기총회
개최지
대전 컨벤션 센터(KOREA)

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