Comparative Analysis of n- and p-type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching

Comparative Analysis of - and -type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching
  • Koo, Ryun-Han
  • Shin, Wonjun
  • Ryu, Sangwoo
  • Lee, Kyungmin
  • Park, Sung-Ho
  • ... Kwon, Daewoong
  • 외 6명
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초록

We re-evaluate the performance of the <italic>p</italic>-type ferroelectric tunnel junction (FTJp) by introducing a perspective that includes non-ferroelectric (FE) resistive switching (RS). Contrary to the previous studies that FTJp exhibits significantly lower on-current density (<italic>J</italic>on) compared to the <italic>n</italic>-type FTJ (FTJn), our observations show that FTJp exhibits comparable <italic>J</italic>on to FTJn, thus achieving a higher tunneling electroresistance (TER) ratio. By analyzing low-frequency noise and temperature dependence of the fatigue rate, we demonstrate that the non-FE RS causes the increase in the <italic>J</italic>on and TER ratio of FTJp. Furthermore, we discover a new advantage of FTJp: It exhibits lower read noise than FTJn in the operating region governed by the FE RS.

키워드

Ferroelectric tunnel junction (FTJ)hafnium zirconium oxide (HfZrO)p-type Sifatigue mechanismsELECTRORESISTANCETRANSISTORSMECHANISMSCONDUCTIONFILMS
제목
Comparative Analysis of n- and p-type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching
제목 (타언어)
Comparative Analysis of - and -type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching
저자
Koo, Ryun-HanShin, WonjunRyu, SangwooLee, KyungminPark, Sung-HoIm, JiseongKo, Jong-HyunKim, Jeong-HyunKwon, DongseokKim, Jae-JoonKwon, DaewoongLee, Jong-Ho
DOI
10.1109/LED.2023.3305602
발행일
2023-10
유형
Article
저널명
IEEE Electron Device Letters
44
10
페이지
1624 ~ 1627