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Comparative Analysis of n- and p-type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching
- Koo, Ryun-Han;
- Shin, Wonjun;
- Ryu, Sangwoo;
- Lee, Kyungmin;
- Park, Sung-Ho;
- ... Kwon, Daewoong;
- 외 6명
WEB OF SCIENCE
16SCOPUS
15초록
We re-evaluate the performance of the <italic>p</italic>-type ferroelectric tunnel junction (FTJp) by introducing a perspective that includes non-ferroelectric (FE) resistive switching (RS). Contrary to the previous studies that FTJp exhibits significantly lower on-current density (<italic>J</italic>on) compared to the <italic>n</italic>-type FTJ (FTJn), our observations show that FTJp exhibits comparable <italic>J</italic>on to FTJn, thus achieving a higher tunneling electroresistance (TER) ratio. By analyzing low-frequency noise and temperature dependence of the fatigue rate, we demonstrate that the non-FE RS causes the increase in the <italic>J</italic>on and TER ratio of FTJp. Furthermore, we discover a new advantage of FTJp: It exhibits lower read noise than FTJn in the operating region governed by the FE RS.
키워드
- 제목
- Comparative Analysis of n- and p-type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching
- 제목 (타언어)
- Comparative Analysis of - and -type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching
- 저자
- Koo, Ryun-Han; Shin, Wonjun; Ryu, Sangwoo; Lee, Kyungmin; Park, Sung-Ho; Im, Jiseong; Ko, Jong-Hyun; Kim, Jeong-Hyun; Kwon, Dongseok; Kim, Jae-Joon; Kwon, Daewoong; Lee, Jong-Ho
- 발행일
- 2023-10
- 유형
- Article
- 권
- 44
- 호
- 10
- 페이지
- 1624 ~ 1627