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"Double-layer" method to improve image quality of industria SPECT
- Park, Jang Guen;
- Seo, Hyeonglim;
- Kim, Chan Hyeong;
- Jung, Seunghun ;
- Kim, Jongbum;
- 외 2명
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Inspection with gamma rays; Detection of defects
- 제목
- "Double-layer" method to improve image quality of industria SPECT
- 저자
- Park, Jang Guen; Seo, Hyeonglim; Kim, Chan Hyeong; Jung, Seunghun ; Kim, Jongbum; Moon, Jinho; Kim, Yeong Sam
- 발행일
- 2012-01
- 유형
- Correction
- 권
- 7
- 호
- 1
- 페이지
- 1 ~ 2