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In-situ monitoring system equipped with FT-IR and QMS, and thermal decomposition of Zr(NCH₃C₂H₅)₄ precursor
- Park, I.-S.;
- Seong, S.;
- Jung, Y.C.;
- Lee, T.;
- Ahn, J.;
- 외 2명
초록
An in-situ monitoring system equipped with both fourier transform infrared (FT-IR) spectroscopy and quadrupole mass spectroscopy (QMS) was introduced to measure the decomposition of tetrakis(ethylmethylamino)zirconium (TEMAZr, Zr(NCH₃C₂H₅)₄), a precursor which is often used in ALD of ZrO₂ films. For the actual influence of the decomposition state of the metalorganic precursor on the properties of the produced film, Zr(NCH₃C₂H₅)4 precursor was heated in the temperature range from 100 °C to 200 °C with steps of 25 °C. The acquisition data from FT-IR and QMS at 500 °C were used as a reference for the fully decomposed precursor, to compare with those obtained at lower temperatures. The increase of the IR peak at 2962 cm⁻¹ due to the asymmetrical C-H stretch mode in CH3 ligands and the appearance of a weak peak around 710 cm⁻¹ due to wagging N-H bonds were useful in monitoring the decomposition of Zr(NCH3C2H5)4, where the latter started to appear as of 125 °C, indicating the onset temperature of decomposition. © 2016 The Electrochemical Society.
- 제목
- In-situ monitoring system equipped with FT-IR and QMS, and thermal decomposition of Zr(NCH₃C₂H₅)₄ precursor
- 제목 (타언어)
- In-situ monitoring system equipped with FT-IR and QMS, and thermal decomposition of Zr(NCH3C2H5)4 precursor
- 저자
- Park, I.-S.; Seong, S.; Jung, Y.C.; Lee, T.; Ahn, J.; An, J.-K.; Yun, J.
- 발행일
- 2016-10-02
- 학회명
- Symposium on Atomic Layer Deposition Applications 12 - PRiME 2016/230th ECS Meeting
- 개최국가
- 미국
- 학회 개최일
- 2016-10-02 ~ 2016-10-07