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Defect Analysis for Field-Effect-Transistor Based on 2D Materials: Drain Current Transient Approach
- 제목
- Defect Analysis for Field-Effect-Transistor Based on 2D Materials: Drain Current Transient Approach
- 저자
- 정문석
- 발행일
- 2024-04-24
- 학회명
- 2024 KPS Spring Meeting
- 개최지
- 대전컨벤션센터