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Electrical Characterization of InAs/InP Self-Assembled Quantum Dots by Deep Level Transient Spectroscopy

  • 김은규
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Electrical Characterization of InAs/InP Self-Assembled Quantum Dots by Deep Level Transient Spectroscopy
저자
김은규
발행일
2003-10-30
학회명
2003 International Microprocesses and Nanotechnology Conference
개최지
Tokyo, Japan

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