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Dynamic characteristics measurement of thin semiconductor layer
- Park, Buhm;
- Lee, Soonbok;
- Kim, Hyungik;
- Park, Jun hong
Citations
SCOPUS
0키워드
Ultra-thin layer; Transfer function method; Multi-layerd semiconductor; Young’s modulus; Loss factor
- 제목
- Dynamic characteristics measurement of thin semiconductor layer
- 저자
- Park, Buhm; Lee, Soonbok; Kim, Hyungik; Park, Jun hong
- 발행일
- 2011-08
- 유형
- Conference Paper
- 저널명
- ICCM International Conferences on Composite Materials
- 페이지
- 1 ~ 2