Learning-based Mutant Reduction Using Fine-grained Mutation Operators

Kim, Yunho; Hong, Shin

doi:10.1109/ICST53961.2022.00065

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Learning-based Mutant Reduction Using Fine-grained Mutation Operators

Kim, Yunho;
Hong, Shin

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초록

This is an extended abstract of the article: Yunho Kim and SHin Hong, Learning-based Mutant Reduction Using Fine-grained Mutation Operators, Journal of Software Testing, Verification and Reliability, e1786, https://doi.org/10.1002/stvr.1786

키워드

Cost-considerate linear regression; Mutant reduction; Mutation analysis; Mutation operator; Mutation score prediction; Cost reduction; Software reliability; Software testing; Verification; Abstracting; reductions; Cost-considerate linear regression; Extended abstracts; Fine grained; Mutant reduction; Mutation analysis; Mutation operators; Mutation score; Mutation score prediction; Software testings

제목: Learning-based Mutant Reduction Using Fine-grained Mutation Operators

저자: Kim, Yunho; Hong, Shin

DOI: 10.1109/ICST53961.2022.00065

발행일: 2022-04

유형: Proceedings Paper

저널명: 2022 IEEE 15TH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION (ICST 2022)

페이지: 464 ~ 464