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A study of encapsulation structure for TFT reliability in top emission OLED display
- Jae Young Oh;
- SeungHee Nam;
- Kwon-Shik Park;
- SooYoung Yoon;
- InByeong Kang;
- ... Jae Kyeong Jeong
Citations
SCOPUS
0초록
Preventing hydrogen and water vapor from permeating through encapsulation layer plays an important role in TFT Reliability. To improve a blocking characteristic, enca psulation inorganic layers were studied. A multilayered ino rganic deposition method for Organic Light Emitting Displ ay has been developed to obtain a reliable performance. SiNx and SiO2 were used to create a multilayered structur e of the inorganic encapsulation and its blocking ability against hydrogen, water vapor permeation was compared with a single inorganic encapsulation. In conclusion, the inorganic multi-structure of encapsulation has shown an advanced performance in blocking.
키워드
Encapsulation; Hydrogen; Multilayer; Oxide; Hydrogen; Light emission; Organic light emitting diodes (OLED); Silica; Silicon; Water vapor; Deposition methods; Encapsulation layer; Inorganic layers; Multilayered structur; Organic light-emitting; Reliable performance; TFT reliability; Water vapor permeation; Thin film transistors
- 제목
- A study of encapsulation structure for TFT reliability in top emission OLED display
- 저자
- Jae Young Oh; SeungHee Nam; Kwon-Shik Park; SooYoung Yoon; InByeong Kang; Jae Kyeong Jeong
- 발행일
- 2019-11
- 유형
- Conference Paper
- 저널명
- Proceedings of the International Display Workshops
- 권
- 2
- 페이지
- 910 ~ 913
- 언어
- ENG
- 분량
- 4 페이지
- ISSN
- P 1883-2490