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The device instability of thermally annealed TiOx Thin film transistors under gate bias stresses
- 제목
- The device instability of thermally annealed TiOx Thin film transistors under gate bias stresses
- 저자
- 박진성
- 발행일
- 2012-09-16
- 학회명
- International conference on electronic materials and nanotechnology for green environment