CMS RPC link system tester and quality control

Esfandi, F.; Ebrahimi, M.; Zareian, E.; Amoozegar, V.; Hosseini, Y.; Boghrati, B.; Mohammadi Najafabadi, M.; Kim, T.J.; Asilar, E.; Ryou, Y.; Tytgat, M.; Mota Amarilo, K.; Samalan, A.; Skovpen, K.; Alves, G.; Alves Coelho, E.; Marujo da Silva, F.; Barroso Ferreira Filho, M.; Da Costa, E.; De Jesus Damiao, D.; Ferreira, B.; Fonseca De Souza, S.; Mundim, L.; Nogima, H.; Pinheiro, J.; Santoro, A.; Thiel, M.; Gomes De Souza, R.; Aleksandrov, A.; Hadjiiska, R.; Iaydjiev, P.; Shopova, M.; Sultanov, G.; Dimitrov, A.; Litov, L.; Pavlov, B.; Petkov, P.; Petrov, A.; Shumka, E.; Cao, P.; Diao, W.; Gong, W.; Hou, Q.; Kou, H.; Liu, Z.-A.; Song, J.; Wang, N.; Zhao, J.; Qian, S.; Avila, C.; Barbosa Trujillo, D.; Cabrera, A.; Florez, C.; Reyes Vega, J.; Aly, R.; Radi, A.; Assran, Y.; Crotty, I.; Mahmoud, M.; Balleyguier, L.; Chen, X.; Combaret, C.; Galbit, G.; Gouzevitch, M.; Grenier, G.; Laktineh, I.; Luciol, A.; Mirabito, L.; Tromeur, W.; Bagaturia, I.; Kemularia, O.; Lomidze, I.; Tsamalaidze, Z.; Abbrescia, M.; De Filippis, N.; Iaselli, G.; Loddo, F.; Pugliese, G.; Ramos, D.; Benussi, L.; Bianco, S.; Meola, S.; Piccolo, D.; Buontempo, S.; Carnevali, F.; Lista, L.; Paolucci, P.; Fienga, F.; Braghieri, A.; Montagna, P.; Riccardi, C.; Salvini, P.; Vitulo, P.; Choi, S.; Hong, B.; Lee, K.; Goh, J.; Shin, J.; Lee, Y.; Pedraza, I.; Uribe Estrada, C.; Castilla-Valdez, H.; Lopez-Fernandez, R.; Sánchez Hernández, A.; Ramírez García, M.; Ramirez Guadarrama, D.; Shah, M.; Vazquez, E.; Zaganidis, N.; Ahmad, A.; Asghar, M.; Hoorani, H.; Muhammad, S.; Eysermans, J.

doi:10.1088/1748-0221/20/06/P06023

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CMS RPC link system tester and quality control

Esfandi, F.;
Ebrahimi, M.;
Zareian, E.;
Amoozegar, V.;
Hosseini, Y.;
... Kim, T.J.;
외 108명

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초록

The Link System of resistive plate chambers (RPC) within the CMS Muon detector is being upgraded as part of CMS upgrade phase-2, aimed at optimising performance for the high luminosity LHC (HL-LHC) environment. This upgrade employs new electronics to improve Muon hit timing resolution and handle higher data rates. Key components of the upgraded system are the link boards and control boards. For the phase-2 upgrade, 1,592 boards need to be produced. The production is divided into two phases, pilot production and full production, to secure the quality of the entire production. This paper outlines a three-step production test plan for the pilot production of the Link System. This test plan ensures quality and functionality by performing primary quality control, basic electronics tests, and advanced system performance testing sequentially. Each step is subject to strict quality control and requires approval before proceeding. This structured approach optimizes error detection and resolution, leading to accurate and reliable results and ensuring that the upgraded system meets the operational requirements of the HL-LHC.

키워드

Data acquisition circuits; Data acquisition concepts; Digital electronic circuits; Trigger concepts and systems (hardware and software); Data quality; Digital circuits; Microstrip devices; Phase comparators; Quality control

제목: CMS RPC link system tester and quality control

저자: Esfandi, F.; Ebrahimi, M.; Zareian, E.; Amoozegar, V.; Hosseini, Y.; Boghrati, B.; Mohammadi Najafabadi, M.; Kim, T.J.; Asilar, E.; Ryou, Y.; Tytgat, M.; Mota Amarilo, K.; Samalan, A.; Skovpen, K.; Alves, G.; Alves Coelho, E.; Marujo da Silva, F.; Barroso Ferreira Filho, M.; Da Costa, E.; De Jesus Damiao, D.; Ferreira, B.; Fonseca De Souza, S.; Mundim, L.; Nogima, H.; Pinheiro, J.; Santoro, A.; Thiel, M.; Gomes De Souza, R.; Aleksandrov, A.; Hadjiiska, R.; Iaydjiev, P.; Shopova, M.; Sultanov, G.; Dimitrov, A.; Litov, L.; Pavlov, B.; Petkov, P.; Petrov, A.; Shumka, E.; Cao, P.; Diao, W.; Gong, W.; Hou, Q.; Kou, H.; Liu, Z.-A.; Song, J.; Wang, N.; Zhao, J.; Qian, S.; Avila, C.; Barbosa Trujillo, D.; Cabrera, A.; Florez, C.; Reyes Vega, J.; Aly, R.; Radi, A.; Assran, Y.; Crotty, I.; Mahmoud, M.; Balleyguier, L.; Chen, X.; Combaret, C.; Galbit, G.; Gouzevitch, M.; Grenier, G.; Laktineh, I.; Luciol, A.; Mirabito, L.; Tromeur, W.; Bagaturia, I.; Kemularia, O.; Lomidze, I.; Tsamalaidze, Z.; Abbrescia, M.; De Filippis, N.; Iaselli, G.; Loddo, F.; Pugliese, G.; Ramos, D.; Benussi, L.; Bianco, S.; Meola, S.; Piccolo, D.; Buontempo, S.; Carnevali, F.; Lista, L.; Paolucci, P.; Fienga, F.; Braghieri, A.; Montagna, P.; Riccardi, C.; Salvini, P.; Vitulo, P.; Choi, S.; Hong, B.; Lee, K.; Goh, J.; Shin, J.; Lee, Y.; Pedraza, I.; Uribe Estrada, C.; Castilla-Valdez, H.; Lopez-Fernandez, R.; Sánchez Hernández, A.; Ramírez García, M.; Ramirez Guadarrama, D.; Shah, M.; Vazquez, E.; Zaganidis, N.; Ahmad, A.; Asghar, M.; Hoorani, H.; Muhammad, S.; Eysermans, J.

DOI: 10.1088/1748-0221/20/06/P06023

발행일: 2025-06

유형: Article

저널명: Journal of Instrumentation

권: 20

호: 6

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