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Electrical Characteristics and Reliability Evaluation of IGZO TFTs under Hydrogen Plasma Treatement and Thermal Stress
- 제목
- Electrical Characteristics and Reliability Evaluation of IGZO TFTs under Hydrogen Plasma Treatement and Thermal Stress
- 저자
- 이승백
- 발행일
- 2025-11-10
- 학회명
- The 4th Korea International Semiconductor Converence & Exhibition on Manufacturing Technology
- 개최지
- Paradise Hotel Busan, Busan