Effects of the electronic threshold on the performance of the RPC system of the CMS experiment

Elmetenawee, W.; Samalan, A.; Tytgat, M.; Zaganidis, N.; Alves, G. A.; Marujo, F.; Torres Da Silva De Araujo, F.; Da Costa, E. M.; De Jesus Damiao, D.; Nogima, H.; Santoro, A.; De Souza, S. Fonseca; Aleksandrov, A.; Hadjiiska, R.; Iaydjiev, P.; Rodozov, M.; Shopova, M.; Sultanov, G.; Bonchev, M.; Dimitrov, A.; Litov, L.; Pavlov, B.; Petkov, P.; Petrov, A.; Qian, S. J.; Bernal, C.; Cabrera, A.; Fraga, J.; Sarkar, A.; Elsayed, S.; Assran, Y.; El Sawy, M.; Mahmoud, M. A.; Mohammed, Y.; Combaret, C.; Gouzevitch, M.; Grenier, G.; Laktineh, I; Mirabito, L.; Shchablo, K.; Bagaturia, I; Lomidze, D.; Lomidze, I; Bhatnagar, V; Gupta, R.; Kumari, P.; Singh, J.; Amoozegar, V; Boghrati, B.; Ebraimi, M.; Ghasemi, R.; Najafabadi, M. Mohammadi; Zareian, E.; Abbrescia, M.; Aly, R.; De Filippis, N.; Gelmi, A.; Iaselli, G.; Leszki, S.; Loddo, F.; Margjeka, I; Pugliese, G.; Ramos, D.; Benussi, L.; Bianco, S.; Piccolo, D.; Buontempo, S.; Di Crescenzo, A.; Fienga, F.; De Lellis, G.; Lista, L.; Meola, S.; Paolucci, P.; Braghieri, A.; Salvini, P.; Montagna, P.; Riccardi, C.; Vitulo, P.; Francois, B.; Kim, T. J.; Park, J.; Choi, S. Y.; Hong, B.; Lee, Ks; Goh, J.; Lee, H.; Eysermans, J.; Estrada, C. Uribe; Pedraza, I; Castilla-Valdez, H.; Sanchez-Hernandez, A.; Mondragon Herrera, C. A.; Perez Navarro, D. A.; Ayala Sanchez, G. A.; Carrillo, S.; Vazquez, E.; Radi, A.; Ahmad, A.; Asghar, I; Hoorani, H.; Muhammad, S.; Shah, M. A.; Crotty, I

doi:10.1088/1748-0221/15/09/C09025

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Effects of the electronic threshold on the performance of the RPC system of the CMS experiment

Elmetenawee, W.;
Samalan, A.;
Tytgat, M.;
Zaganidis, N.;
Alves, G. A.;
... Kim, T. J.;
외 97명

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초록

Resistive Plate Chambers have a very important role for muon triggering both in the barrel and in the endcap regions of the CMS experiment at the Large Hadron Collider (LHC). In order to optimize their performance, it is of primary importance to tune the electronic threshold of the front-end boards reading the signals from these detectors. In this paper we present the results of a study aimed to evaluate the effects on the RPC efficiency, cluster size and detector intrinsic noise rate, of variations of the electronics threshold voltage.

키워드

Gaseous detectors; Resistive-plate chambers; Threshold voltage; Particle spectrometers; Cluster sizes; End-cap regions; Front end boards; Intrinsic noise; Large Hadron collider LHC; Resistive plate chambers

제목: Effects of the electronic threshold on the performance of the RPC system of the CMS experiment

저자: Elmetenawee, W.; Samalan, A.; Tytgat, M.; Zaganidis, N.; Alves, G. A.; Marujo, F.; Torres Da Silva De Araujo, F.; Da Costa, E. M.; De Jesus Damiao, D.; Nogima, H.; Santoro, A.; De Souza, S. Fonseca; Aleksandrov, A.; Hadjiiska, R.; Iaydjiev, P.; Rodozov, M.; Shopova, M.; Sultanov, G.; Bonchev, M.; Dimitrov, A.; Litov, L.; Pavlov, B.; Petkov, P.; Petrov, A.; Qian, S. J.; Bernal, C.; Cabrera, A.; Fraga, J.; Sarkar, A.; Elsayed, S.; Assran, Y.; El Sawy, M.; Mahmoud, M. A.; Mohammed, Y.; Combaret, C.; Gouzevitch, M.; Grenier, G.; Laktineh, I; Mirabito, L.; Shchablo, K.; Bagaturia, I; Lomidze, D.; Lomidze, I; Bhatnagar, V; Gupta, R.; Kumari, P.; Singh, J.; Amoozegar, V; Boghrati, B.; Ebraimi, M.; Ghasemi, R.; Najafabadi, M. Mohammadi; Zareian, E.; Abbrescia, M.; Aly, R.; De Filippis, N.; Gelmi, A.; Iaselli, G.; Leszki, S.; Loddo, F.; Margjeka, I; Pugliese, G.; Ramos, D.; Benussi, L.; Bianco, S.; Piccolo, D.; Buontempo, S.; Di Crescenzo, A.; Fienga, F.; De Lellis, G.; Lista, L.; Meola, S.; Paolucci, P.; Braghieri, A.; Salvini, P.; Montagna, P.; Riccardi, C.; Vitulo, P.; Francois, B.; Kim, T. J.; Park, J.; Choi, S. Y.; Hong, B.; Lee, Ks; Goh, J.; Lee, H.; Eysermans, J.; Estrada, C. Uribe; Pedraza, I; Castilla-Valdez, H.; Sanchez-Hernandez, A.; Mondragon Herrera, C. A.; Perez Navarro, D. A.; Ayala Sanchez, G. A.; Carrillo, S.; Vazquez, E.; Radi, A.; Ahmad, A.; Asghar, I; Hoorani, H.; Muhammad, S.; Shah, M. A.; Crotty, I

DOI: 10.1088/1748-0221/15/09/C09025

발행일: 2020-09

유형: Article; Proceedings Paper

저널명: Journal of Instrumentation

권: 15

호: 9

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