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"Double-layer" Method to Improve Image Quality of Industrial SPECT
- 제목
- "Double-layer" Method to Improve Image Quality of Industrial SPECT
- 저자
- 김찬형
- 발행일
- 2011-07-03
- 학회명
- 13th International Workshop on Radiation Imaging Detectors
- 개최지
- Zurich and Villigen PSI, Switzerland