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Electrostatic force microscopy measurements of charge trapping behaviors of Au nanoparticles embedded in metal-insulator-semiconductor structure
초록
1
- 제목
- Electrostatic force microscopy measurements of charge trapping behaviors of Au nanoparticles embedded in metal-insulator-semiconductor structure
- 저자
- 홍진표
- 발행일
- 2007-06-10
- 학회명
- International Scanning Probe Microscopy Conference 2007
- 개최지
- Jeju