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Stability of Amorphous in-Ga-Zn-O Thin Film Transistors with Silicon-Doped Back-Channel Layer under Temperature Humidity Stresses

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Stability of Amorphous in-Ga-Zn-O Thin Film Transistors with Silicon-Doped Back-Channel Layer under Temperature Humidity Stresses
저자
박재근
발행일
2014-10-07
학회명
226th ECS Meeting
개최지
Moon Palace Resort

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