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초록
The electrical and structural properties of platinum silicided p-type Schottky barrier metal-oxide-semiconductor field-effect transistors with physical gate lengths scaled down to 20 nm have been investigated. Constant built-in potential clipped at source/drain contacts for shorter channel length is responsible for negative shift of threshold voltage with decreasing gate length.
키워드
MOSFETS; SIMULATION; GATE
- 제목
- Platinum silicided p-type Schottky barrier metal-oxide-semiconductor field-effect transistors scaled down to 20 nm
- 저자
- Choi, Chel-Jong ; Jang, Myung-Gil; Kim, Yark Yeon; Jun, Myung-Sim; Kim, Tae-Youb; Lee, Seongjae
- 발행일
- 2008-01
- 유형
- Article
- 권
- 44
- 호
- 2
- 페이지
- 159 ~ 160