A new approach for CMS RPC current monitoring using Machine Learning techniques

Samalan, A.; Tytgat, M.; Zaganidis, N.; Alves, G. A.; Marujo, F.; Da Silva De Araujo, F. Torres; Da Costa, E. M.; De Jesus Damiao, D.; Nogima, H.; Santoro, A.; Fonseca De Souza, S.; Aleksandrov, A.; Hadjiiska, R.; Iaydjiev, P.; Rodozov, M.; Shopova, M.; Sultanov, G.; Bonchev, M.; Dimitrov, A.; Litov, L.; Pavlov, B.; Petkov, P.; Petrov, A.; Qian, S. J.; Bernal, C.; Cabrera, A.; Fraga, J.; Sarkar, A.; Elsayed, S.; Assran, Y.; El Sawy, M.; Mahmoud, M. A.; Mohammed, Y.; Combaret, C.; Gouzevitch, M.; Grenier, G.; Laktineh, I; Mirabito, L.; Shchablo, K.; Bagaturia, I; Lomidze, D.; Lomidze, I; Bhatnagar, V; Gupta, R.; Kumari, P.; Singh, J.; Amoozegar, V; Boghrati, B.; Ebraimi, M.; Ghasemi, R.; Najafabadi, M. Mohammadi; Zareian, E.; Abbrescia, M.; Aly, R.; Elmetenawee, W.; Filippis, N.; Gelmi, A.; Iaselli, G.; Leszki, S.; Loddo, F.; Margjeka, I; Pugliese, G.; Ramos, D.; Benussi, L.; Bianco, S.; Piccolo, D.; Buontempo, S.; Di Crescenzo, A.; Fienga, F.; De Lellis, G.; Lista, L.; Meola, S.; Paolucci, P.; Braghieri, A.; Salvini, P.; Montagna, P.; Riccardi, C.; Vitulo, P.; Francois, B.; Kim, T. J.; Park, J.; Choi, S. Y.; Hong, B.; Lee, K. S.; Goh, J.; Lee, H.; Eysermans, J.; Uribe Estrada, C.; Pedraza, I; Castilla-Valdez, H.; Sanchez-Hernandez, A.; Mondragon Herrera, C. A.; Perez Navarro, D. A.; Ayala Sanchez, G. A.; Carrillo, S.; Vazquez, E.; Radi, A.; Ahmad, A.; Asghar, I; Hoorani, H.; Muhammad, S.; Shah, M. A.; Crottya, I

doi:10.1088/1748-0221/15/10/C10009

상세 보기

A new approach for CMS RPC current monitoring using Machine Learning techniques

Samalan, A.;
Tytgat, M.;
Zaganidis, N.;
Alves, G. A.;
Marujo, F.;
... Kim, T. J.;
외 97명

Citations

WEB OF SCIENCE

1

Citations

SCOPUS

1

초록

The CMS experiment has 1054 RPCs in its muon system. Monitoring their currents is the first essential step towards maintaining the stability of the CMS RPC detector performance. The current depends on several parameters such as applied voltage, luminosity, environmental conditions, etc. Knowing the influence of these parameters on the RPC current is essential for the correct interpretation of its instabilities as they can be caused either by changes in external conditions or by malfunctioning of the detector in the ideal case. We propose a Machine Learning(ML) based approach to be used for monitoring the CMS RPC currents. The approach is crucial for the development of an automated monitoring system capable of warning for possible hardware problems at a very early stage, which will contribute further to the stable operation of the CMS RPC detector.

키워드

Large detector-systems performance; Resistive-plate chambers; Machine learning; Turing machines; Monitoring; Applied voltages; Automated monitoring systems; Current monitoring; Detector performance; Environmental conditions; External conditions; Hardware problems; Machine learning techniques

제목: A new approach for CMS RPC current monitoring using Machine Learning techniques

저자: Samalan, A.; Tytgat, M.; Zaganidis, N.; Alves, G. A.; Marujo, F.; Da Silva De Araujo, F. Torres; Da Costa, E. M.; De Jesus Damiao, D.; Nogima, H.; Santoro, A.; Fonseca De Souza, S.; Aleksandrov, A.; Hadjiiska, R.; Iaydjiev, P.; Rodozov, M.; Shopova, M.; Sultanov, G.; Bonchev, M.; Dimitrov, A.; Litov, L.; Pavlov, B.; Petkov, P.; Petrov, A.; Qian, S. J.; Bernal, C.; Cabrera, A.; Fraga, J.; Sarkar, A.; Elsayed, S.; Assran, Y.; El Sawy, M.; Mahmoud, M. A.; Mohammed, Y.; Combaret, C.; Gouzevitch, M.; Grenier, G.; Laktineh, I; Mirabito, L.; Shchablo, K.; Bagaturia, I; Lomidze, D.; Lomidze, I; Bhatnagar, V; Gupta, R.; Kumari, P.; Singh, J.; Amoozegar, V; Boghrati, B.; Ebraimi, M.; Ghasemi, R.; Najafabadi, M. Mohammadi; Zareian, E.; Abbrescia, M.; Aly, R.; Elmetenawee, W.; Filippis, N.; Gelmi, A.; Iaselli, G.; Leszki, S.; Loddo, F.; Margjeka, I; Pugliese, G.; Ramos, D.; Benussi, L.; Bianco, S.; Piccolo, D.; Buontempo, S.; Di Crescenzo, A.; Fienga, F.; De Lellis, G.; Lista, L.; Meola, S.; Paolucci, P.; Braghieri, A.; Salvini, P.; Montagna, P.; Riccardi, C.; Vitulo, P.; Francois, B.; Kim, T. J.; Park, J.; Choi, S. Y.; Hong, B.; Lee, K. S.; Goh, J.; Lee, H.; Eysermans, J.; Uribe Estrada, C.; Pedraza, I; Castilla-Valdez, H.; Sanchez-Hernandez, A.; Mondragon Herrera, C. A.; Perez Navarro, D. A.; Ayala Sanchez, G. A.; Carrillo, S.; Vazquez, E.; Radi, A.; Ahmad, A.; Asghar, I; Hoorani, H.; Muhammad, S.; Shah, M. A.; Crottya, I

DOI: 10.1088/1748-0221/15/10/C10009

발행일: 2020-10

유형: Article; Proceedings Paper

저널명: Journal of Instrumentation

권: 15

호: 10

페이지: 1 ~ 10