Sensitivity analysis for robust performance of electrical machines affected by manufacturing tolerance

Lee, S.-G.; Kim, S.; Park, M.-R.; Lee, T.H.; Hong, J.-P.

doi:10.1049/cp.2019.0114

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Sensitivity analysis for robust performance of electrical machines affected by manufacturing tolerance

Lee, S.-G.;
Kim, S.;
Park, M.-R.;
Lee, T.H.;
Hong, J.-P.

Citations

SCOPUS

2

초록

Considering effects of manufacturing tolerance on a performance, a robust design optimization using a surrogate model is applied for an electrical machine. When constructing the surrogate model for the robust design, it can be required to reduce the number of design variables because of the high computational costs. Therefore, a sensitivity analysis method for robust performance which is affected by manufacturing tolerance is investigated in this paper. Analysis of variance (ANOVA) is employed for the sensitivity analysis. An orthogonal array using a combination of inner and outer array is used for the ANOVA. The proposed method was applied to an interior permanent magnet synchronous motor and the results were verified with a Monte Carlo simulation.

키워드

Analysis of variance; Design of experiment; Manufacturing tolerance; Robust performance; Sensitivity analysis; Computational electromagnetics; Design of experiments; Electric machinery; Fits and tolerances; Intelligent systems; Manufacture; Monte Carlo methods; Permanent magnets; Sensitivity analysis; Computational costs; Design variables; Electrical machine; Interior permanent magnet synchronous motor; Manufacturing tolerances; Orthogonal array; Robust design optimization; Robust performance; Analysis of variance (ANOVA)

제목: Sensitivity analysis for robust performance of electrical machines affected by manufacturing tolerance

저자: Lee, S.-G.; Kim, S.; Park, M.-R.; Lee, T.H.; Hong, J.-P.

DOI: 10.1049/cp.2019.0114

발행일: 2019-00

유형: Conference Paper

저널명: IET Conference Publications

권: 2019

호: CP753

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