Nitrogen concentration in ZnO films grown by magnetron sputtering in an Ar-NO plasma

  • Kononenko, Oleg V
  • Noh, YS
  • Kim, Tae Whan
  • Choi, WK
Citations

SCOPUS

2

초록

Nitrogen-doped ZnO films are grown on (0001)-oriented sapphire substrates by magnetron RF sputtering in an Ar-NO plasma at a pressure of about 10 mTorr and Ar-to-NO flow-rate ratios of 0-90. It is revealed that the nitrogen concentration in the films depends on the Ar-to-NO flow-rate ratios as well as on the nitrogen concentration in the process environment. The highest doping level of nitrogen (4.3 at %) is achieved in films deposited at a substrate temperature of 300°C and an Ar-to-NO flow-rate ratio of 90:1. These films are found to contain Zn-N bonds, but not N-O bonds.

키워드

ArgonChemical bondsMagnetron sputteringNitrogen compoundsNitrogen oxidesPlasmasSapphireSubstratesAr-NO plasmaDoping levelNitrogen-doped ZnO filmsZinc oxide
제목
Nitrogen concentration in ZnO films grown by magnetron sputtering in an Ar-NO plasma
저자
Kononenko, Oleg VNoh, YSKim, Tae WhanChoi, WK
DOI
10.1134/S1063739707010039
발행일
2007-02
유형
Article
저널명
Russian Microelectronics
36
1
페이지
27 ~ 32