ScholarWorks@한양대학교

상세 보기

Multi-Wavelength High Resolution Micro-Raman and Optical Reflectance Characterization of Nano-Scale Strained Silicon-on-Insulator Substrates

  • 박재근
제목
Multi-Wavelength High Resolution Micro-Raman and Optical Reflectance Characterization of Nano-Scale Strained Silicon-on-Insulator Substrates
저자
박재근
발행일
2012-10-09
학회명
222nd ECS Meeting
개최지
Hawaii Convention Center and the Hilton Hawaiian Village

ScholarWorks@한양대학교

(04763) 서울특별시 성동구 왕십리로 222 Tel. +82-2-2220-1370 +82-2-2220-1366

COPYRIGHT © 한양대학교 All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.