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Defect Analysis for Field-Effect-Transistor Based on 2D Materials: Drain Current Transient, 1/f noise, and Arrhenius Approach
- 제목
- Defect Analysis for Field-Effect-Transistor Based on 2D Materials: Drain Current Transient, 1/f noise, and Arrhenius Approach
- 저자
- 정문석
- 발행일
- 2024-11-19
- 학회명
- N2D 2024
- 개최지
- 스위스 그랜드 호텔