A 50 ms/s First-Order Mismatch Error Shaping and Third-Order Noise-Shaping SAR ADC for IOT Applications

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초록

This article presents a first order Mismatch Error Shaping (MES) and third-order Noise Shaping (NS) Successive Approximation Register (SAR) analog to digital converter (ADC). We choose fully dynamic hardware reusing (HR) error feedback, cascade of integrators with feed forward (EF-CIFF) structure to reduce the power consumption, and to increase the sampling speed. In addition, to enhance the resolution, a MES scheme with two-level digital prediction is implemented to remove the distortion caused by the capacitive digital to analog converter (CDAC) mismatch. The SPICE level simulations of the proposed ADC implemented using a 28-nm CMOS process show 85 dB signal-to-noise-distortion ratio (SNDR) with 1.56 MHz bandwidth (oversampling ratio (OSR) = 16).

키워드

Hardware Reusing EF-CIFF StructureMismatch Error Shaping (MES)Noise-Shaped SAR ADCSplit Capacitor Array Digital to Analog Converter (DAC)Two-Level Digital PredictionDigital-to-analog convertersError feedbackFeed forwardHardware reusing error feedback, cascade of integrator with feed forward structureMismatch error shapingMismatch errorsNoise-shaped successive approximation register analog to digital converterSplit capacitor array digital to analog converterSplit-capacitor arraysSuccessive approximation register analog-to-digital converterTwo-level digital prediction
제목
A 50 ms/s First-Order Mismatch Error Shaping and Third-Order Noise-Shaping SAR ADC for IOT Applications
저자
Jang, Jin-YeopPark, Sang-Gyu
DOI
10.1109/IC-NIDC59918.2023.10390566
발행일
2023-11
유형
Conference paper
저널명
Proceedings of 2023 8th IEEE International Conference on Network Intelligence and Digital Content, IC-NIDC 2023
페이지
481 ~ 485