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Surface Roughness Mobility Analysis of Ultra-thin Body Silicon-on-insulator n-MOSFET using Improved Electric Field Model

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Surface Roughness Mobility Analysis of Ultra-thin Body Silicon-on-insulator n-MOSFET using Improved Electric Field Model
저자
박재근
발행일
2008-04-18
학회명
한국물리학회 2008년 봄 학술발표회 및 제84회 정기총회
개최지
대전 컨벤션 센터(KOREA)

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