Carrier transport mechanisms of nonvolatile write-once-read-many-times memory devices with InP-ZnS core-shell nanoparticles embedded in a polymethyl methacrylate layer

  • Ham, Jung Hoon
  • Oh, Do Hyun
  • Cho, Sung Hwan
  • Jung, Jae Hun
  • Kim, Tae Whan
  • 외 2명
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초록

Current-voltage (I-V) curves at 300 K for Al/InP-ZnS nanoparticles embedded in a polymethyl methacrylate layer/Al devices showed electrical bistability for write-once-read-many-times (WORM) memory devices. From the I-V curves, the ON/OFF ratio for the device with InP-ZnS nanoparticles was significantly larger than that for the device without InP-ZnS nanoparticles, indicative of the existence of charge capture in the InP nanoparticles. The estimated retention time of the ON state for the WORM memory device was more than 10 years. The carrier transport mechanisms for the WORM memory devices are described by using several models to fit the experimental I-V data.

키워드

aluminiumIII-V semiconductorsII-VI semiconductorsindium compoundsnanoparticlesrandom-access storagewide band gap semiconductorswrite-once storagezinc compoundsTHIN-FILMBISTABILITYNANOCRYSTALSPERFORMANCE
제목
Carrier transport mechanisms of nonvolatile write-once-read-many-times memory devices with InP-ZnS core-shell nanoparticles embedded in a polymethyl methacrylate layer
저자
Ham, Jung HoonOh, Do HyunCho, Sung HwanJung, Jae HunKim, Tae WhanRyu, Eui DockKim, Sang Wook
DOI
10.1063/1.3097805
발행일
2009-03
유형
Article
저널명
Applied Physics Letters
94
11
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