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Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes
- 제목
- Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes
- 저자
- 최병덕
- 발행일
- 2022-06-27
- 학회명
- IEEE International Symposium on Hardware Oriented Security and Trust
- 개최지
- 미국 Washington D.C