Electrical Characteristics of Thin-Film Transistors Fabricated Utilizing a UV/Ozone-Treated TiO2 Channel Layer

  • Chong, Ho Yong
  • Kim, Tae Whan
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초록

Thin-film transistors (TFTs) utilizing TiO2 channel layers were fabricated by using a solution process. Atomic force microscopy images showed that the surface morphology of the TiO2 films became uniform due to the ultraviolet (UV)/ozone treatment. X-ray photoelectron spectroscopy showed that the UV/ozone treatment reduced the amount of oxygen deficiency in the TiO2 films, resulting in a decrease of the electron concentration on the surface. The performance of the TFT devices was significantly improved due to a decrease of the off-current level resulting from the enhanced uniformity and the decrease of the trap level resulting from the UV/ozone treatment.

키워드

Thin-film transistorTiO2 channel layerstructural propertieselectrical characteristicsINDIUM-TIN-OXIDELIGHT-EMITTING-DIODESULTRAVIOLETPHOTOEMISSIONSPECTROSCOPYSURFACES
제목
Electrical Characteristics of Thin-Film Transistors Fabricated Utilizing a UV/Ozone-Treated TiO2 Channel Layer
저자
Chong, Ho YongKim, Tae Whan
DOI
10.1007/s11664-012-2348-3
발행일
2013-03
유형
Article
저널명
Journal of Electronic Materials
42
3
페이지
398 ~ 402