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초록
Thin-film transistors (TFTs) utilizing TiO2 channel layers were fabricated by using a solution process. Atomic force microscopy images showed that the surface morphology of the TiO2 films became uniform due to the ultraviolet (UV)/ozone treatment. X-ray photoelectron spectroscopy showed that the UV/ozone treatment reduced the amount of oxygen deficiency in the TiO2 films, resulting in a decrease of the electron concentration on the surface. The performance of the TFT devices was significantly improved due to a decrease of the off-current level resulting from the enhanced uniformity and the decrease of the trap level resulting from the UV/ozone treatment.
키워드
Thin-film transistor; TiO2 channel layer; structural properties; electrical characteristics; INDIUM-TIN-OXIDE; LIGHT-EMITTING-DIODES; ULTRAVIOLET; PHOTOEMISSION; SPECTROSCOPY; SURFACES
- 제목
- Electrical Characteristics of Thin-Film Transistors Fabricated Utilizing a UV/Ozone-Treated TiO2 Channel Layer
- 저자
- Chong, Ho Yong; Kim, Tae Whan
- 발행일
- 2013-03
- 유형
- Article
- 권
- 42
- 호
- 3
- 페이지
- 398 ~ 402