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Photo-Induced Current Transient Defect Analyses of Oxide Semiconductor Materials by Fast Fourier Transformation and 1D Convolutional Neural Networks
- 제목
- Photo-Induced Current Transient Defect Analyses of Oxide Semiconductor Materials by Fast Fourier Transformation and 1D Convolutional Neural Networks
- 저자
- 홍진표
- 발행일
- 2024-06-04
- 학회명
- the 21st international symposium on the physics of semiconductors and applications
- 개최지
- 제주도