Vacuum-based long-term thermal stability evaluation of metal-organic precursors for atomic layer deposition

Citations

WEB OF SCIENCE

0
Citations

SCOPUS

0

초록

Understanding the long-term thermal stability of metal-organic precursors is critical for maintaining consistent and reliable atomic layer deposition (ALD) performance. Conventional evaluations, such as thermogravimetric analysis (TGA) and bulk long-term thermal stability tests in sealed containers, do not reproduce the vacuum exposure and pressure fluctuations encountered under practical ALD process environments. In this work, we developed a vacuum-based long-term stability evaluation platform that reproduces process-relevant pressure cycling while enabling extended thermal treatment and periodic, atmosphere-free sampling of liquid precursors. Using tetrakis(ethylmethylamino)hafnium (TEMAHf) as a model precursor, we compare non-pumping, 6-h cyclic pumping, and 1-h cyclic pumping environments and track degradation using colorimetry, TGA residual mass, viscosity, and vapor pressure. More frequent pressure cycling accelerates degradation, evidenced by stronger color changes, increased non-volatile residue accumulation, higher viscosity, and reduced vapor pressure. These results indicate that non-vacuum, non-cycling tests can underestimate process-relevant long-term degradation and highlight the need for vacuum-and pressure cycling-based protocols to screen precursor stability and guide precursor and process optimization in ALD.

키워드

Vacuum; Long-term thermal stability; Metal-organic precursor; TEMAHf; Atomic layer deposition; THIN-FILMS; ALD; HAFNIUM; SURFACE
제목
Vacuum-based long-term thermal stability evaluation of metal-organic precursors for atomic layer deposition
저자
Lim, Jaeuk; Kim, Hayeong; Maeng, Seonjeong; Kim, Jong-Man; Yun, Ju-Young
DOI
10.1016/j.mssp.2026.111145
발행일
2027-01
유형
Article
저널명
Materials Science in Semiconductor Processing
권
217
페이지
1 ~ 6

파일 다운로드

Thumbnail