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- 제목
- Dependences of Electrical Properties on the Shape of the Recess Field in the Nanoscale Tantalum Nitride-Aluminium Oxide-Silicon nitride-Silicon Oxide-Silicon Memory Devices
- 저자
- 김태환
- 발행일
- 2010-11-08
- 학회명
- International Conference On Nano Science and Nano Technology (ICNST2010)
- 개최지
- Oryonghall, Gwangu Institute of Science And Technology(GIST), Gwangu ,Korea