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Reliability issue by Vpass induced carrier injection phenomenon in 3D NAND Flash memory

제목
Reliability issue by Vpass induced carrier injection phenomenon in 3D NAND Flash memory
저자
송윤흡
발행일
2019-11-19
학회명
한국반도체디스플레이기술학회 추계학술대회
개최지
한양대학교

ScholarWorks@한양대학교

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