Challenging issues for terra-bit-level perpendicular STT-MRAM

  • Park, JG
  • Shim, TH
  • Chae, KS
  • Lee, DY
  • Takemura, Y
  • ... Hong, Jin Pyo
  • 외 4명
Citations

SCOPUS

15

초록

The current challenging issues for terra-bit-level perpendicular STT-MRAM cells have been reviewed in the view of four critical parameters such as TMR ratio, Δ, Jex, and α. The TMR ratio of p-MTJ spin-valves are reaching to < 150% at the BEOL of >350°C. A single MgO based p-MTJ spin-valve could not satisfy Δ of > 74, proposing a double MgO based p-MTJ spin-valve. Jex in SyAF layer adequately met > 0.7erg/cm2 at BEOL of > 350°C. A Co2Fe6B2 based p-MTJ spin-valve limits to a of 0.005, necessary to develop a low α material such as full Heusler half-metal. Thus, an essential challenge in the future is to satisfy four critical parameters simultaneously at > 350°C and 300-mm TiN electrode wafers.

키워드

Electron devicesIron compoundsMagnesiaMagnetic devicesMagnetoresistanceTitanium nitrideBit levelHalf metalsHeuslerLow alphaSpin valveSTT-MRAMTiN electrodesMagnetic recording
제목
Challenging issues for terra-bit-level perpendicular STT-MRAM
저자
Park, JGShim, THChae, KSLee, DYTakemura, YLee, SEJeon, MSBaek, JUPark, SOHong, Jin Pyo
DOI
10.1109/IEDM.2014.7047081
발행일
2015-02
유형
Conference Paper
저널명
Technical Digest - International Electron Devices Meeting
2015-February
February
페이지
19.2.1 ~ 19.2.4