Optical spectroscopy of single Cd0.6Zn0.4Te/ZnTe quantum dots on Si substrate

Lee, Hong Seok; Rastelli, Armando; Kim, Tae Whan; Park, Hong Lee; Schmidt, Oliver G.

doi:10.1016/j.tsf.2011.04.128

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Optical spectroscopy of single Cd0.6Zn0.4Te/ZnTe quantum dots on Si substrate

Lee, Hong Seok;
Rastelli, Armando;
Kim, Tae Whan;
Park, Hong Lee;
Schmidt, Oliver G.

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초록

Microphotoluminescence (mu-PL) measurements were carried out to investigate the optical properties of single Cd0.6Zn0.4Te/ZnTe quantum dots (QDs) grown on Si (001) substrate by using molecular beam epitaxy. The high quality of single Cd0.6Zn0.4Te/ZnTe QDs is witnessed by resolution-limited emission, negligible background and absence of measurable spectral jitter or blinking. Polarization-dependent and power-dependent mu-PL spectroscopy measurements were performed to identify the exciton, the biexciton, and the charged exciton in the emission spectra of single QDs. Furthermore a weak linearly polarized line is observed on the low energy side of the neutral exciton and is ascribed to dark exciton recombination.

키워드

Cadmium zinc telluride; II-VI compound semiconductors; Quantum dots; Si substrate; Single dot spectroscopy; Photoluminescence; Molecular beam epitaxy; ELECTRON-SPIN; EXCITONS

제목: Optical spectroscopy of single Cd0.6Zn0.4Te/ZnTe quantum dots on Si substrate

저자: Lee, Hong Seok; Rastelli, Armando; Kim, Tae Whan; Park, Hong Lee; Schmidt, Oliver G.

DOI: 10.1016/j.tsf.2011.04.128

발행일: 2011-07

유형: Article

저널명: Thin Solid Films

권: 519

호: 19

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