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Wafer classification using a convolutional neural network considering small and imbalanced wafer map data

이동희

제목: Wafer classification using a convolutional neural network considering small and imbalanced wafer map data

저자: 이동희

발행일: 2019-12-05

학회명: The 20th Asia Pacific Industrial Engineering And Management Systems

개최지: 일본 가나자와