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Inverse thickness estimation of non-opaque specimens using continuous-wave laser transmittance with the transfer matrix method and genetic algorithm
- Lee, Seo Jun;
- Kim, Hyun Jun;
- Moon, Seung Jae
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0초록
This study proposes a method for estimating thickness by inverting continuous-wave laser transmittance data using an optical model formulated using the transfer matrix method and optimized using a genetic algorithm. The proposed framework was experimentally validated using four types of optical materials—quartz, K9 glass, polyimide, and acrylic—under both pristine and contaminated surface conditions. To reflect the attenuation caused by surface scattering in the analysis, a model for reconstructing transmittance was developed and applied. Experiments conducted at wavelengths of 532 and 2200 nm demonstrated that the estimated thickness exhibited strong agreement with the actual thickness under both conditions. The results confirmed stable inversion performance, with relative errors remaining within a few percent under the investigated conditions. These findings suggest that the proposed method provides a reliable and precise approach for estimating the thickness of non-opaque specimens in practical experimental environments.
키워드
- 제목
- Inverse thickness estimation of non-opaque specimens using continuous-wave laser transmittance with the transfer matrix method and genetic algorithm
- 저자
- Lee, Seo Jun; Kim, Hyun Jun; Moon, Seung Jae
- 발행일
- 2026-10
- 유형
- Article
- 권
- 287
- 페이지
- 1 ~ 13