상세 보기

Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study

Kim, Joo Hyung;
Park, SHK;
Jeong, HY;
Park, C;
Choi, SY;
... Yoon, TH;
외 2명

Citations

WEB OF SCIENCE

5

Citations

SCOPUS

5

키워드

grazing-incidence X-ray diffraction; ZnO; thin film transistors

제목: Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study

저자: Kim, Joo Hyung; Park, SHK; Jeong, HY; Park, C; Choi, SY; Choi, JY; Han, SH; Yoon, TH

DOI: 10.5012/bkcs.2008.29.4.727

발행일: 2008-04

유형: Article

저널명: Bulletin of the Korean Chemical Society

권: 29

호: 4

페이지: 727 ~ 728

언어: ENG

출판사: WILEY-V C H VERLAG GMBH

발행국가: 독일

분량: 2 페이지

ISSN: P 1229-5949

파일 다운로드