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Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study
- Kim, Joo Hyung;
- Park, SHK;
- Jeong, HY;
- Park, C;
- Choi, SY;
- ... Yoon, TH;
- 외 2명
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grazing-incidence X-ray diffraction; ZnO; thin film transistors
- 제목
- Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study
- 저자
- Kim, Joo Hyung; Park, SHK; Jeong, HY; Park, C; Choi, SY; Choi, JY; Han, SH; Yoon, TH
- 발행일
- 2008-04
- 유형
- Article
- 권
- 29
- 호
- 4
- 페이지
- 727 ~ 728