ScholarWorks@한양대학교
조직
연구자
연구성과
저널
English
상세 보기
Segregation Behavior of Copper and Tantalum in Oxide Film and Si Substrate after Device Heat-treatment
박재근
Citation
APA
CHICAGO
MLA
VANCOUVER
IEEE
HARVARD
Export
XML (DC)
EXCEL
제목
Segregation Behavior of Copper and Tantalum in Oxide Film and Si Substrate after Device Heat-treatment
저자
박재근
발행일
2012-10-10
학회명
222nd ECS Meeting
개최지
Hawaii Convention Center and the Hilton Hawaiian Village
더보기