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Surface passivation effect on CZT-metal contact
- Park, Se Hwan;
- Ha, Han Soo;
- Cho, Yoon-Ho;
- Kim, Han Soo;
- Kang, Sang Mook;
- ... Kim, Yong Kyun;
- 외 1명
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6초록
The process of cadmium zinc telluride (CZT) surface passivation is very important to reduce the leakage current of the detector and to improve the detector performance. NH4/H2O2 solution was identified as an effective passivation agent for CZT. We fabricated a CZT planar detector and measured the detector performances before and after the NH4/H2O2 passivation. For the first time, the passivation effect on CZT-metal contact was measured. The depth profile of the chemical composition of metal contact was measured with AES to understand the change of the CZT detector performance with passivation.
키워드
cadmium zinc telluride (CZT); leakage current; metal-semiconductor contact; surface passivation; CADMIUM ZINC TELLURIDE; CDZNTE DETECTORS; PERFORMANCE; CRYSTALS; CDTE; RAY
- 제목
- Surface passivation effect on CZT-metal contact
- 저자
- Park, Se Hwan; Ha, Han Soo; Cho, Yoon-Ho; Kim, Han Soo; Kang, Sang Mook; Kim, Yong Kyun; Kim, Jong Kyung
- 발행일
- 2008-06
- 유형
- Article; Proceedings Paper
- 권
- 55
- 호
- 3
- 페이지
- 1547 ~ 1550