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Reliability Characteristics for Magnetic Tunnel Junctions with MgO Tunnel Bar-rier in Low Voltage
- 제목
- Reliability Characteristics for Magnetic Tunnel Junctions with MgO Tunnel Bar-rier in Low Voltage
- 저자
- 송윤흡
- 발행일
- 2017-09-21
- 학회명
- 2017 International Conference on Solid State Devices and Materials
- 개최지
- Sendai, Japan