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A 80x60 Micro-Bolometer CMOS Thermal Imager Integrated with a Low-Noise 12-Bit DAC
- Kim, Ki-Duk;
- Park, Seunghyun;
- Lee, Byunghun;
- Lee, Hyung-Min;
- Cho, Gyu-Hyeong
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5초록
A low-cost 80x60 micro-bolometer CMOS thermal imager is presented. The imager system integrated with a proposed 12-bit biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300x faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference (NETD). The low-noise biasing DAC adopts a current-mode divider- stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-bit biasing DAC in a 0.18 m CMOS imager IC has a low noise of 1.89 Vrms and INL/DNL of 0.14/0.09 LSB, respectively.
키워드
Calibration; CMOS thermal imager; Computer architecture; Digital-to-analog converter (DAC); Integrated circuits; Linearity; Micro-bolometer; Microprocessors; NETD; Thermal noise; Voltage measurement; Bolometers; Digital to analog conversion; Infrared detectors; Bit inversion; Commercial products; Current-mode dividers; Micro-bolometers; Noise equivalent temperature difference; Stacking structures; Startup time; Thermal imagers; CMOS integrated circuits
- 제목
- A 80x60 Micro-Bolometer CMOS Thermal Imager Integrated with a Low-Noise 12-Bit DAC
- 저자
- Kim, Ki-Duk; Park, Seunghyun; Lee, Byunghun; Lee, Hyung-Min; Cho, Gyu-Hyeong
- 발행일
- 2022-08
- 유형
- Article
- 권
- 69
- 호
- 8
- 페이지
- 8604 ~ 8608