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Effect fo the interface carrier density on the device property fo the ZnO thin film transistor fabricated by Atomic Layer Deposition method

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Effect fo the interface carrier density on the device property fo the ZnO thin film transistor fabricated by Atomic Layer Deposition method
저자
전형탁
발행일
2009-06-08
학회명
E-MRS 2009 Spring Meeting
개최지
congress center strasbourg, France

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