Shrinkage and expansion mechanisms of SiO2 elliptical membrane nanopores

Shin, Jae Won; Lee, Jeong Yong; Oh, Do Hyun; Kim, Tae Whan; Cho, Woon Jo

doi:10.1063/1.3027062

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Shrinkage and expansion mechanisms of SiO2 elliptical membrane nanopores

Shin, Jae Won;
Lee, Jeong Yong;
Oh, Do Hyun;
Kim, Tae Whan;
Cho, Woon Jo

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WEB OF SCIENCE

6

Citations

SCOPUS

7

초록

20 nm SiO2 elliptical membrane nanopores with various thicknesses were directly formed in situ by using a focused electron beam with transmission electron microscopy (TEM). The shrinkage and the expansion behaviors of the SiO2 ellipse nanopores with different thicknesses were attributed to variations in their geometries, in particular their curvatures. The geometric mechanisms of elliptical nanopores with various thicknesses fabricated utilizing a SiO2 membrane with a thickness gradient by using an electron beam irradiation are described on the basis of TEM images, which depend on the electron beam irradiation time.

키워드

electron beam effects; geometry; nanoporous materials; nanotechnology; shrinkage; silicon compounds; transmission electron microscopy; DNA TRANSLOCATION; DISCRIMINATION; MOLECULES; FABRICATION; TRANSPORT

제목: Shrinkage and expansion mechanisms of SiO2 elliptical membrane nanopores

저자: Shin, Jae Won; Lee, Jeong Yong; Oh, Do Hyun; Kim, Tae Whan; Cho, Woon Jo

DOI: 10.1063/1.3027062

발행일: 2008-12

유형: Article

저널명: Applied Physics Letters

권: 93

호: 22

페이지: 1 ~ 3