High-Performance All-Solid-State Batteries Enabled by Intimate Interfacial Contact Between the Cathode and Sulfide-Based Solid Electrolytes

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초록

All-solid-state batteries (ASSBs) are considered the ultimate next-generation rechargeable batteries due to their high safety and energy density. However, poor Li-ion kinetics caused by the inhomogeneous distribution of the solid electrolytes (SEs) and complex chemo-mechanical behaviors lead to poor electrochemical properties. In this study, LiNi0.8Co0.1Mn0.1O2 (NCM) (core) – Li6PS5Cl (LPSCl) SEs (shell) particles (NCM@LPSCl) are prepared by a facile mechano-fusion method to improve the electrochemical properties and increase the energy density of ASSBs. The conformally coated thin SEs layer on the surface of NCM enables homogeneous distribution of SEs in overall electrode and intimate physical contact with cathode material even under volume change of cathode material during cycling, which leads to the improvement in Li-ion kinetics without the increase in solid electrolyte content. As a result, an ASSBs employing NCM@LPSCl with 4 mAh cm−1 specific areal capacity exhibits robust electrochemical properties, including the improved reversible capacity (163.1 mAh g−1), cycle performance (90.0% after 100 cycles), and rate capability (discharge capacity of 152.69, 133.80, and 100.97 mAh g−1 at 0.1, 0.2, and 0.5 C). Notably, ASSBs employing NCM@LPSCl composite show reliable electrochemical properties with a high weight fraction of NCM (87.3 wt%) in the cathode.

키워드

all-solid-state batteriescathodesinterfacesmechano-fusionsulfide-based solid electrolytesINTERPHASE FORMATIONLITHIUM BATTERIESLINI0.8CO0.15AL0.05O2ELECTRODESCAPACITY
제목
High-Performance All-Solid-State Batteries Enabled by Intimate Interfacial Contact Between the Cathode and Sulfide-Based Solid Electrolytes
저자
Kim, JeongheonKim, Min Ji김재익Lee, Jin Woong박준혁Wang, Sung Eun이승우Kang, Yun ChanPaik, UngyuJung, Dae SooSong, Taeseup
DOI
10.1002/adfm.202211355
발행일
2023-03
유형
Article in Press
저널명
Advanced Materials for Optics and Electronics
33
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