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Reliability Prediction of Gate Dielectrics Based on Percolation Models Using Fractal Structure
- 제목
- Reliability Prediction of Gate Dielectrics Based on Percolation Models Using Fractal Structure
- 저자
- 배석주
- 발행일
- 2019-11-27
- 학회명
- 5th International Conference on Materials and Reliability
- 개최지
- Jeju Island, Korea