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Electrical Uniformity Mapping of Carbon Nanotube Thin-Films using Non-invasive Surface Contact Probing Technique
- 제목
- Electrical Uniformity Mapping of Carbon Nanotube Thin-Films using Non-invasive Surface Contact Probing Technique
- 저자
- 이승백
- 발행일
- 2010-11-15
- 학회명
- The 11th Asia Pacific Physics Conference
- 개최지
- Shanghai, China